Semiconductor memory device capable of increasing writing speed

ABSTRACT

A memory cell array has a structure in which a plurality of memory cells connected with word lines and bit lines and connected in series are arranged in a matrix form. A selection transistor selects the word lines. A control circuit controls potentials of the word lines and the bit lines in accordance with input data, and controls write, read and erase operations of data with respect to the memory cell. The selection transistor is formed on a well, and a first negative voltage is supplied to a well, a first voltage (the first voltage≧the first negative voltage) is supplied to a selected word line and a second voltage is supplied to a non-selected word line in the read operation.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. application Ser. No.11/457,320 filed Jul. 13, 2006 now U.S. Pat. No. 7,411,824, and is basedupon and claims the benefit of priority from prior Japanese PatentApplication No. 2005-205950, filed Jul. 14, 2005, the entire contents ofeach of which are incorporated herein by reference.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to, e.g., an NAND flash memory using anEEPROM, and more particularly to a semiconductor memory device capableof storing multivalued data in a single memory cell.

2. Description of the Related Art

In an NAND flash memory, a plurality of memory cells arranged in acolumn direction are connected in series to constitute NAND cells, andeach NAND cell is connected with a corresponding bit line through aselection gate. Each bit line is connected with a latch circuit whichlatches write data and read data. All or a half of a plurality of cellsarranged in a row direction are simultaneously selected, and a write orread operation is collectively carried out with respect to all or a halfof the cells selected at the same time. The plurality of NAND cellsarranged in the row direction constitute a block, and an erase operationis executed in this block unit. In the erase operation, a thresholdvoltage of the memory cells is set to a negative voltage. Injectingelectrons into the memory cells in a write operation can set thethreshold voltage to a positive voltage (see, e.g., Jpn. Pat. Appln.Publication No. 2004-192789).

Meanwhile, in the NAND cell, the memory cells are connected in series.Therefore, in a read operation, a non-selected cell must be in an onstate, a voltage (Vread) higher than a threshold voltage is applied to agate electrode of the non-selected cell. Therefore, in the writeoperation, the threshold voltage set with respect to cells must notexceed Vread, and a threshold distribution is controlled in such amanner that it does not exceed Vread by repeatedly executing a programoperation and a program verify read operation in accordance with eachbit in a write sequence.

Further, in recent years, with an increase in a capacity of a memory, amultivalued memory which stores two or more bits in one cell has beendeveloped. For example, in order to store two bits in one cell, fourthreshold distributions must be set in such a manner that eachdistribution does not exceed Vread. Therefore, each thresholddistribution must be controlled to be narrowed as compared with a casewhere one bit or two threshold distributions are stored in one cell.Furthermore, in order to store three bits or four bits in one cell,eight or 16 threshold distributions must be set. Therefore, adistribution width of each threshold voltage must be greatly narrowed.In order to narrow a distribution width of a threshold voltage in thismanner, a program and a verify operation must be precisely repeated, andthere occurs a problem of a decrease in a writing speed. Therefore, asemiconductor memory device capable of increasing a writing speed hasbeen demanded.

BRIEF SUMMARY OF THE INVENTION

According to a first aspect of the invention, there is provided asemiconductor memory device comprising: a memory cell array having aplurality of memory cells which are arranged in a matrix form andconnected in series, the plurality of memory cells being connected withword lines and bit lines; a selection transistor which selects the wordlines; and a control circuit which controls potentials of the word linesand the bit lines in accordance with input data, the control circuitcontrolling write, read and erase operations of data with respect to thememory cells, wherein the selection transistor is formed on a well, anda first negative voltage is supplied to the well, a first voltage (thefirst voltage≧ the first negative voltage) is supplied to a selectedword line and a second voltage is supplied to a non-selected word linein the read operation.

According to a second aspect of the invention, there is provided asemiconductor memory device comprising: a memory cell array having aplurality of memory cells which are arranged in a matrix form andconnected in series, the plurality of memory cells being connected withword lines and bit lines; a selection transistor which selects the wordlines; a control circuit which controls potentials of the word lines andthe bit lines in accordance with input data, the control circuitcontrolling write, read and erase operations of data with respect to thememory cells, wherein the selection transistor is formed on a well, anda first negative voltage is supplied to the well and a first voltage(the first voltage≧ the first negative voltage) is supplied to apredetermined non-selected word line in the write operation.

According to a third aspect of the invention, there is provided asemiconductor memory device comprising: a memory cell array having aplurality of memory cells which are arranged in a matrix form, theplurality of memory cells being connected with word lines and bit lines;a selection transistor which selects the word lines; and a controlcircuit which controls potentials of the word lines and the bit lines inaccordance with input data, the control circuit controlling write, readand erase operations of data with respect to the memory cells, whereinthe selection transistor is formed on a well, and a first negativevoltage is supplied to the well and a first voltage (the first voltage≧the first negative voltage) is supplied to a selected word line in anerase verify read operation.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWING

FIGS. 1A and 1B are a view showing a relationship between thresholdvoltages in a related art and the present embodiment;

FIG. 2 is a structural view showing an example of a semiconductor memorydevice according to the present embodiment;

FIG. 3 is a circuit diagram showing a configuration of a memory cellarray and a bit line control circuit depicted in FIG. 2;

FIGS. 4A and 4B are cross-sectional views showing a memory cell and aselection transistor;

FIG. 5 is a cross-sectional view showing a semiconductor memory deviceaccording to the present embodiment;

FIG. 6 is a view showing a potential supplied to each well in an eraseoperation, a program and a read operation according to the presentembodiment;

FIG. 7 is a circuit diagram showing an example of a data storage circuitdepicted in FIG. 3;

FIG. 8 is a circuit diagram showing an example of a negative voltagegenerator circuit depicted in FIG. 2;

FIGS. 9A, 9B and 9C are views showing a relationship between data in amemory cell and a threshold value of the memory cell;

FIG. 10 is a view showing a writing order in the present embodiment;

FIG. 11 is a view showing a transfer gate constituting a part of a rowdecoder depicted in FIG. 2;

FIG. 12 is a flowchart showing a write operation for a first page;

FIG. 13 is a flowchart showing the write operation for a second page;

FIGS. 14A and 14B are views showing a voltage of each portion in an RLSBwrite mode, and FIG. 14C is a view showing a voltage of each portion inan REASB write mode; and

FIGS. 15A, 15B and 15C are views showing a modification of the presentembodiment.

DETAILED DESCRIPTION OF THE INVENTION

FIGS. 1A and 1B show a relationship between threshold voltages of arelated art and the present embodiment. FIGS. 1A and 1B show a casewhere four-valued data consisting of two bits is stored.

As shown in FIG. 1B, in the present embodiment, a plurality of negativethreshold voltages which are not greater than, e.g., 0 V are also set.When the plurality of negative threshold voltages are also set in thismanner, each threshold distribution width can be increased withoutchanging Vread. Therefore, the number of times of executing a program ora verify operation can be decreased, and a writing speed can beincreased.

In order to set such threshold voltages, the following structure isrequired. That is, in order to set a negative voltage in a gateelectrode of a selected cell, a negative potential must be set in a wordline. Therefore, for example, an N-channel MOS transistor with a highwithstand voltage constituting a row decoder is formed in a P-type well(which will be referred to as a P-well) region, and a negative voltageis supplied to this P-well region. At this time, Vread (e.g., 5 V) issupplied to a non-selected word line in a selected block to achieveelectrical conduction of the non-selected cell.

Moreover, in writing “1” (non-writing), there has been designed awriting mode which is referred to as RLSB (Revised Local Self Boost) orREASB (Revised Erased Local Self Boost) in order to avoid erroneouswriting. In this writing mode, a channel region of a cell which is inclose proximity to a write cell in an NAND cell is set to OFF tofacilitate booting a potential of the channel region. Therefore, aground potential is supplied to a word line. However, in the presentembodiment, when a cell is an erase cell, its threshold voltage has alarger negative value as compared with the related art as indicated bydata “0” in FIG. 1B. Therefore, a negative potential must be supplied tothe word line in order to turn off the channel region of the cell whichis in close proximity to the write cell.

An embodiment according the present invention will now be describedhereinafter with reference to the accompanying drawings.

FIG. 2 shows a configuration of a semiconductor memory device accordingto this embodiment which is specifically an NAND flash memory whichstores, e.g., four-valued (two-bit) data.

A memory cell array 1 includes a plurality of bit lines, a plurality ofword lines and a common source line, and memory cells which consist of,e.g., EEPROM cells and in which data can be electrically rewritten arearranged in a matrix form in the memory cell array 1. A bit controlcircuit 2 which controls bit lines and a word line control circuit 6 areconnected with this memory cell array 1.

The bit line control circuit 2 reads data in the memory cells in thememory cell array 1 through bit lines, detects states of the memorycells in the memory cell array 1 through the bit lines, or applies awrite control voltage to the memory cells in the memory cell array 1through the bit lines to write data in the memory cells. A columndecoder 3 and a data input/output buffer 4 are connected with the bitline control circuit 2. A data storage circuit in the bit line controlcircuit 2 is selected by the column decoder 3. Data in each memory cellread to the data storage circuit is output to the outside from a datainput/output terminal 5 through the data input/output buffer 4.

Additionally, write data input to the data input/output terminal 5 fromthe outside is input to the data storage circuit selected by the columndecoder 3 through the data input/output buffer 4.

The word line control circuit 6 includes a row decoder 6-1. The wordline control circuit 6 selects a word line in the memory cell array 1through the row decoder 6-1, and applies a voltage required for a read,write or erase operation to the selected word line.

The memory cell array 1, the bit line control circuit 2, the columndecoder 3, the data input/output buffer 4 and the word line controlcircuit 6 are connected with and controlled by a control signal andcontrol voltage generator circuit 7. The control signal and controlvoltage generator circuit 7 is connected with a control signal inputterminal 8, and controlled by a control signal input from the outsidethrough the control signal input terminal 8. The control signal andcontrol voltage generator circuit 7 includes a later-described negativevoltage generator circuit 7-1. This negative voltage generator circuit7-1 generates a negative voltage in the data write or read operation.

The bit line control circuit 2, the column decoder 3, the word linecontrol circuit 6, the control signal and control voltage generatorcircuit 7 constitute a write circuit and a read circuit.

FIG. 3 shows a configuration of the memory cell array 1 and the bit linecontrol circuit 2 depicted in FIG. 2. A plurality of NAND cells arearranged in the memory cell array 1. One NAND cell is constituted of,e.g., 32 memory cells MC each consisting of an EEPROM which areconnected in series, and selection gates S1 and S2. The selection gateS2 is connected with a bit line BL0e, and the selection gate S1 isconnected with a source line SRC. Control gates of the memory cells MCarranged in each row are equally connected with word lines WL0 to WL29,WL30 and WL 31. Further, the selection gate S2 is equally connected witha select line SGD, and the selection gate S1 is equally connected with aselect line SGS.

The bit line control circuit 2 has a plurality of data storage circuits10. A pair of bit lines (BL0 e, BL0 o), (BL1 e, BL1 o) . . . (BLie,BLio) or (BL8 ke, BL8 ko) are connected with each data storage circuit10.

As indicated by a broken line, the memory cell array 1 includes aplurality of blocks. Each block is constituted of the plurality of NANDcells, and data is erased in units of, e.g., this block. Furthermore, anerase operation is simultaneously carried out with respect to the twobit lines connected with the data storage circuit 10.

Moreover, a plurality of memory cells (memory cells in a rangesurrounded by the broken line) which are arranged every other bit lineand connected with one word line constitute one sector. Data is writtenand read in accordance with each sector.

In a read operation, a program verify operation and a program operation,one bit line is selected from the two bit lines (BLie, BLio) connectedwith the data storage circuit 10 in accordance with an address signal(YA0, YA1 . . . YAi . . . YA8 k) supplied from the outside.Additionally, one word line is selected in accordance with an externaladdress.

FIGS. 4A and 4B are cross-sectional views of the memory cell and theselection transistor. FIG. 4A shows the memory cell. n-type diffusionlayers 42 as a source and a drain of the memory cell are formed in asubstrate 51 (a later-described P-well region 55). A floating gate (FG)44 is formed above the P-well region 55 through a gate insulating film43, and a control gate (CG) 46 is formed above this floating gate 44through an insulating film 45. FIG. 4B shows the selection gate. n-typediffusion layers 47 as a source and a drain are formed in the P-wellregion 55. A control gate 49 is formed above the P-well region 55through a gate insulating film 48.

FIG. 5 is a cross-sectional view showing a semiconductor memory device.For example, N-type well (which will be referred to as N-wellhereinafter) regions 52, 53, 54 and 56 and a P-well region 57 areformed, e.g., in a P-type semiconductor substrate 51. A P-well region 55is formed in the N-well region 52, and a low-voltage N-channel MOStransistor LVNTr constituting the memory cell array 1 is formed in thisP-well region 55. Further, a low-voltage P-channel MOS transistor LVPTrand a low-voltage N-channel MOS transistor LVNTr constituting the datastorage circuit 10 are formed in the N-well region 53 and the P-wellregion 57.

A P-well region 58 is formed in the N-well region 56, and a high-voltageN-channel MOS transistor HVNTr constituting the row decoder 6-1 isformed in this P-well region 58. Furthermore, a high-voltage P-channelMOS transistor HVPTr constituting, e.g., a word line drive circuit isformed in the N-well region 54. The high-voltage transistor HVNTr orHVPTr has, e.g., a gate insulating film thicker than that of thelow-voltage transistor LVNTr or LVPTr.

FIG. 6 shows a potential supplied to each well in the erase, program andread operations. A negative potential, e.g., −2V is supplied to theP-well 58 in which the N-channel MOS transistor constituting the rowdecoder 6-1 is formed in the program and data read operations.

FIG. 7 is a circuit diagram showing an example of the data storagecircuit 10 depicted in FIG. 3.

This data storage circuit 10 has a primary data cache (PDC), a secondarycache (SDC), a dynamic data cache (DDC), and a temporary data cache(TDC). The SDC, the PDC and the DDC are used to hold input data in thewrite operation, hold read data in the read operation, temporarily holddata in the verify operation, and operate internal data when storingmultivalued data. The TDC is used to amplify and temporarily hold bitline data when reading data, and operate internal data when storingmultivalued data.

The SDC is constituted of clocked inverter circuits 61 a and 61 bconfiguring a latch circuit and transistors 61 c and 61 d. Thetransistor 61 c is connected between an input end of the clockedinverter circuit 61 a and an input end of the clocked inverter circuit61 b. A signal EQ2 is supplied to a gate of this transistor 61 c. Thetransistor 61 d is connected between an output end of the clockedinverter circuit 61 b and the ground. A signal PRST is supplied to agate of this transistor 61 d. A node N2 a of the SDC is connected withan input/output data line IO through a column selection transistor 61 e,and a node N2 b of the same is connected with an input/output data lineIOn through a column selection transistor 61 f. A column selectionsignal CSLi is supplied to gates of these transistors 61 e and 61 f. Thenode N2 a of the SDC is connected with a node N1 a of the PDC throughtransistors 61 g and 61 h. A signal BLC2 is supplied to a gate of thetransistor 61 g, and a signal BLC1 is supplied to a gate of thetransistor 61 h.

The PDC is constituted of clocked inverter circuits 61 i and 61 j and atransistor 61 k. The transistor 61 k is connected between an input endof the clocked inverter circuit 61 i and an input end of the clockedinverter circuit 61 j. A signal EQ1 is supplied to a gate of thistransistor 61 k. A node N1b of the PDC is connected with a gate of atransistor 611. One end of a current path of this transistor 611 isgrounded through a transistor 61 m. A signal CHK1 is supplied to a gateof this transistor 61 m. Moreover, the other end of the current path ofthe transistor 611 is connected with one end of a current path oftransistors 61 n and 61 o constituting a transfer gate. A signal CHK2 nis supplied to a gate of this transistor 61 n. Additionally, a gate ofthe transistor 610 is connected with a connection node N3 of thetransistors 61 g and 61 h. A signal COMi is supplied to the other end ofthe current path of the transistors 61 n and 61 o. This signal COMi is asignal common to all the data storage circuits 10, and indicates whetherverifying all the data storage circuits 10 has been completed. That is,as will be described later, when the verify operation is completed, thenode N1b of PDC changes to a low level. Assuming that the signals CHK1and CHK2 are on a high level in this state, the signal COMi changes tothe high level if the verify operation is completed.

Further, the TDC is constituted of, e.g., an MOS capacitor 61 p. Thiscapacitor 61 p is connected between the connection node N3 of thetransistors 61 g and 61 h and the ground. Furthermore, the DDC isconnected with the connection node N3 through a transistor 61 q. Asignal REG is supplied to a gate of the transistor 61 q.

The DDC is constituted of transistors 61 r and 61 s. A signal VREG issupplied to one end of a current path of the transistor 61 r, and theother end of this current path is connected with a current path of thetransistor 61 q. A gate of this transistor 61 r is connected with thenode N1 a of the PDC through the transistor 61 s. A signal DTG issupplied to a gate of this transistor 61 s.

Moreover, one end of a current path of transistors 61 t and 61 u isconnected with the connection node N3. A signal VPRE is supplied theother end of the current path of the transistor 61 u, and a signal BLPREis supplied to a gate of the transistor 61 u. A signal BLCLAMP issupplied to a gate of the transistor 61 t. The other end of the currentpath of this transistor 61 t is connected with one end of a bit line BLothrough a transistor 61 v, and further connected with one end of a bitline BLe through a transistor 61 w. Signals BLSo and BLSe arerespectively supplied to gates of these transistors 61 v and 61 w. Theother end of the bit line BLo is connected with one end of a currentpath of a transistor 61 x. A signal BIASo is supplied to a gate of thistransistor 61 x. The other end of the bit line BLe is connected with oneend of a current path of a transistor 61 y. A signal BIASe is suppliedto a gate of this transistor 61 y. A signal BLCRL is fed to the otherend of the current path of these transistors 61 x and 61 y. Thetransistors 61 x and 61 y are complementarily turned on in accordancewith the signals BIASo and BIASe, and supply a potential of the signalBLCRL to a non-selected bit line.

Each signal and voltage mentioned above are generated by the controlsignal and control voltage generator circuit 7 depicted in FIG. 2, andthe following operations are brought under control by this controlsignal and control voltage generator circuit 7.

FIG. 8 shows an example of the negative voltage generator circuit 7-1.The negative voltage generator circuit 7-1 is constituted of, e.g., afour-phase pump circuit PMP, a detection circuit DT, a control section 7d and an oscillator circuit 7 e. The pump circuit PMP is formed of,e.g., a plurality of P-channel MOS transistors PMOS and a plurality ofcapacitors Cp. Each of clock signals CLK1 to CLK4 is supplied to one endof each capacitor Cp. These clock signals CLK1 to CLK4 sequentially turnon the PMOS, thereby generating a negative voltage.

The detection circuit DT is connected with an output end of the pumpcircuit PMP. This detection circuit DT is constituted of a constantcurrent source 7 a, a resistance 7 b and a differential amplifier 7 c.The constant current source 7 a and the resistance 7 b are connected inseries between a node to which a supply power VDD is supplied and theoutput end of the pump circuit PMP. One input end of the differentialamplifier 7 c is connected with a connection node between the constantcurrent source 7 a and the resistance 7 b, and a reference voltage Vrefis supplied to the other end of the differential amplifier 7 c. Thisreference voltage Vref is a voltage of approximately 1 V generated by,e.g., a band gap reference circuit. This detection circuit DT detects anoutput voltage of the pump circuit PMP based on the reference voltageVref. This detection output signal is fed to the control section 7 d.The control section 7 d controls the oscillator circuit 7 e inaccordance with the detection output signal. The oscillator circuit 7 eis oscillated or stopped based on control by the control section 7 b. Inthis manner, a constant negative voltage is generated by the pumpcircuit PMP.

Moreover, the resistance 7 b constitutes a trimming circuit 7 f. Thistrimming circuit 7 f changes a resistance value of the resistance 7 b inaccordance with a trimming signal TM to switch a level of a negativevoltage output from the pump circuit PMP. The trimming signal TM isgenerated by, e.g., the control signal and control voltage generatorcircuit 7 in the data read operation or the program verify operation.Therefore, the negative voltage generator circuit 7-1 generates negativevoltages on various levels in the data read operation or the programverify operation.

Since this memory is a multivalued memory, data consisting of two bitscan be stored in one cell. Two-bit data can be changed over by using anaddress (a first page or a second page).

FIGS. 9A, 9B and 9C show a relationship between data in a memory celland a threshold value of the memory cell. As shown in FIG. 9C, data inthe memory cell becomes “0” when erasing is done. The data “0”corresponds to a negative voltage which is not greater than 0 V. As willbe described later, in order to apply an RLSB or REASB writing mode, averify operation is executed based on a verify voltage “z” aftererasing. When a threshold voltage is not greater than the verify voltage“z”, a write operation is performed until the threshold voltage becomesthe verify voltage “z”.

As shown in FIG. 9A, the data in the memory cell becomes data “0” anddata “2” by writing a first page. Further, as shown in FIG. 9B, afterwriting a second page, the data in the memory cell becomes data “0”,“1”, “2” and “3”. In this embodiment, the data in the memory cell isdefined in an ascending order of the threshold voltage.

FIG. 10 schematically shows a writing order in the present embodiment.As shown in FIG. 10, in a block, a write operation is executed everypage from a memory cell close to a source line. In this case, in orderto eliminate the influence of a threshold voltage of an adjacent memorycell having data previously written therein, the order of writing datain the memory cells is defined as shown in FIG. 9.

FIG. 11 shows a transfer gate constituting a part of the row decoder6-1. This transfer gate is formed of the plurality of N-channel MOStransistors HVNTr. Voltages SGS_DRV, CG0 to CG31 and SGD_DRV aresupplied to one end of each of the transistors HVNTr, and the other endof the same is connected with each of a select line SGS, word lines WL0to WL31 and a select line SGD. A signal TG is supplied to a gate of eachtransistor HVNTr. When the transistor HVNTr of each selected block isturned on in accordance with the signal TG, a predetermined voltage issupplied to the word lines WL0 to WL31 of the cells.

It is to be noted that the P-well region 58 in which the row decoder 6-1is arranged may be divided in accordance with each block (indicated by58 a and 58 b in FIG. 5), or the row decoders of a plurality of or allblocks may be arranged in one P-well region 58 (indicated by 58 c inFIG. 5).

(Read Operation)

As shown in FIG. 9A, after writing the first page, the data in thememory cell becomes “0” or “2”. Therefore, supplying an intermediatelevel “a” of these data to the word line and performing the readoperation enable reading these data. Furthermore, as shown in FIG. 9B,after writing the second page, the data in the memory cell becomes oneof “0”, “1”, “2” and “3”. Therefore, supplying each intermediate level“b”, “c” or “d” of these data to the word line and performing the readoperation enable reading these data. In this embodiment, the level “a”and “b” correspond to negative voltages, for example.

The well of the memory cell (the P-well region 55 in FIG. 5), the sourceline and a non-selected bit line are set to Vss (a ground potential=0V). When the P-well region 58 is divided in accordance with each block,the P-well region 58 of a non-selected block is set to Vss or a negativepotential (e.g., −2 V), and the transfer gate (shown in FIG. 11) of thenon-selected block is turned off. Moreover, when the row decoders of aplurality of or all blocks are arranged in one P-well region 58, theP-well region 58 is set to a negative potential (e.g., −2 V), and thetransfer gate of the non-selected block (shown in FIG. 11) is turnedoff. As a result, the word line of the non-selected block enters afloating state, and the selection gate becomes Vss.

When a negative potential (e.g., −2 V) is supplied to the P-well region58 of the row decoder in a selected block and the transfer gate of theselected block is turned on, a potential in reading (e.g., −2 V to 3V)is supplied to a selected word line of the selected block, Vread (e.g.,5 V) is fed to a non-selected word line of the selected block, and Vsg(Vdd+Vth, e.g., 2.5 V+Vth) is supplied to the selection gate SG1 of theselected block. Here, when the potential in reading is not negative, theP-well region may be set to Vss.

Then, a signal VPRE of the data storage circuit 10 depicted in FIG. 7 isset to Vdd (e.g., 2.5 V), a signal BLPRE is set to Vsg (Vdd+Vth), asignal BLCLAMP is set to, e.g., (0.6 V+Vth), and a bit line ispre-charged to, e.g., 0.6 V. Subsequently, a select line SG2 of the cellon the source side is set to Vdd. When a threshold voltage of the memorycell is higher than the potential in reading, the cell is turned off,and hence the bit line remains in the high level. Additionally, when athreshold voltage of the memory cell is lower than the potential inreading, the cell is turned on, and hence a potential of the bit linebecomes Vss.

Thereafter, the signal BLPRE of the data storage circuit 10 shown inFIG. 7 is temporarily set to Vsg (Vdd+Vth), the node N3 of the TDC ispre-charged to Vdd, and then the signal BLCLAMP is set to, e.g.,(0.45+Vth). The node N3 of the TDC changes to the low level when apotential of the bit line is lower than 0.45 V, and it changes to thehigh level when a potential of the bit line is higher than 0.45 V. Aftersetting the BLCLAMP to Vss, the signal BLC1 is set to Vsg (Vdd+Vth), anda potential of the TDC is read to the PDC. Therefore, the PDC enters thelow level when a threshold voltage of the cell is lower than a potentialof the word line, and the PDC enters the high level when the same ishigher than a potential of the word line. The read operation is executedin this manner.

(Program)

(First Page Write Operation)

FIG. 12 shows a sequence of writing the first page, and FIG. 13illustrates a sequence of writing the second page.

In a program operation, an address is first specified, and a half ofmemory cells (two pages) connected with one word line are selected asshown in FIG. 3. This memory can perform the program operation only inthe order of the first page and the second page of these two pages.Therefore, the first page is first selected by using the address.

In the first page write operation shown in FIG. 12, write data is firstinput from the outside, and it is stored in the SDC of all the datastorage circuits 10 (S11). Then, when a write command is input, data inthe SDC in all the data storage circuits 10 is transferred to the PDC(S12). The node N1 a of the PDC changes to the high level when data “1”(writing is not executed) is input from the outside, and the node N1 aof the PDC changes to the low level when data “0” (writing is executed)is input. Thereafter, the data in the PDC has a potential of the node N1a, and the data in the SDC has a potential of the node N2 a.

(Program Operation) (S13)

In the data storage circuit 10 shown in FIG. 7, when the signal BLC1 isset to Vdd+Vth, the transistor 61 h becomes electrically conductive.Therefore, the bit line is set to Vdd when the data “1” (writing is notexecuted) is stored in the PDC, and the bit line is set to Vss when thedata “1” (writing is executed) is stored in the same. Further, writingmust not be performed in a cell having a non-selected page (a bit lineis not selected) which is connected with a selected word line.Therefore, the bit line connected with such a cell is set to Vdd like abit line to which the data “1” is supplied.

In this state, when the P-well region 58 is divided in accordance witheach block, the P-well region 58 of a non-selected block is set to Vssor a negative potential (e.g., −2 V), and the transfer gate (shown inFIG. 11) of the non-selected block is turned off. When the row decodersof a plurality of or all blocks are arranged in one P-well region 58,the P-well region 58 is set to a negative potential (e.g., −2 V), andthe transfer gate (shown in FIG. 11) of the non-selected block is turnedoff. As a result, the word line of the non-selected block enters thefloating state, and the selection gate has a potential of Vss.

Furthermore, the P-well region 58 of the row decoder in a selected blockis set to a negative potential (e.g., −2 V), and electrical conductionis achieved in the transfer gate of the selected block, whereby Vdd (ora potential slightly lower than Vdd) is supplied to the selection gateSGD of the selected block. Moreover, when Vss is supplied to theselection gate SGS of the selected block, Vpgm (20 V) is supplied to theselected word line and Vpass (10 V) is supplied to the non-selected wordline, a channel of the cell is set to Vss and the word line is set toVpgm if the bit line has a potential of Vss, thereby effecting writing.On the other hand, if the bit line has a potential of Vdd, the channelof the cell is booted by coupling rather than Vss. Therefore, apotential difference between the gate and the channel is reduced, andwriting is not carried out.

When writing is executed in the order depicted in FIG. 10, the number ofcells in which data is written is increased as distanced from the sourceline. Therefore, there is a problem that the channel is hard to bebooted and erroneous writing is executed. In order to solve thisproblem, the RLSB writing mode or the REASB writing mode has beendeveloped. In the RLSB writing mode, an adjoining word line of aselected word line or a word line adjacent to the adjoining word line isset to Vss, and the selected word line is set to Vpgm, and other wordlines are set to Vpass or an intermediate potential. Additionally, inthe REASB writing mode, an adjoining word line of a selected word lineon a source side or a word line adjacent to the adjoining word line isset to Vss, the selected word line is set to Vpgm, and other word linesare set to Vpass or an intermediate potential. The adjoining word lineof the selected word line or the word line adjacent to the adjoiningword line is set to Vss to turn off the memory cell, therebyfacilitating booting a channel immediately below a selected cell.

In this embodiment, however, when a cell whose word line is set to Vssis an erase cell, a threshold value thereof is a negative voltage, andhence this cell is not turned off. Therefore, in case of the presentembodiment, in the RLSB writing mode shown in FIGS. 14A and 14B or theREASB writing mode depicted in FIG. 14C, the adjoining word line of theselected word line or the word line adjacent to the adjoining word lineis se to a negative potential, e.g., (−1.5 V) rather than Vss. Inwriting the first page, data in the memory cell becomes data “0” anddata “2”.

(Program Verify Read) (S14)

A program verify read operation is the same as the read operation, but averify level “a′” which is slightly higher than a read level is suppliedto a word line to perform reading. When a threshold voltage of thememory cell reaches the verify level “a′” based on this verify reading,the PDC has the data “1”, and writing is not executed.

On the other hand, when the threshold voltage of the memory cell doesnot reach the verify level “a′”, the PDC has data “0”. In a case wheredata in all the PDCs in the respective data storage circuits 10 are not“1” (S15), the program is again executed (S13). The program operationand the verify operation are repeated until the data in the PDCs of therespective data storage circuits 10 are all changed to “1”.

(Second Page Write Operation)

In the second page write operation depicted in FIG. 13, write data isfirst input from the outside, and it is stored in the SDCs of all thedata storage circuits 10 (S21). Then, in writing the first page, a readlevel “a” (e.g., a negative voltage) is set to the word line in order toconfirm the written data, thereby reading data in the memory cell (S22).This reading operation is as described above. The PDC changes to the lowlevel when a threshold voltage of the cell is lower than a potential “a”of the word line, and the PDC changes to the high level when the same ishigher than the potential “a” of the word line.

Thereafter, a data cache is set (S23). That is, the second page iswritten as shown in FIG. 9B.

When data is “1” in writing the first page, and when data is “1” inwriting the second page, the second page is not written.

When the data is “1” in writing the first page, and when the data is “0”in writing the second page, the data in the memory cell is set to “1” bywriting the second page.

When the data is “0” in writing the first page, and when the data is “0”in writing the second page, the data in the memory cell is set to “2” bywriting the second page.

When the data is “0” in writing the first page, and when the data is “1”in writing the second page, the data in the cell is set to “3” bywriting the second page.

The data cache is set in order to execute this operation.

That is, in a case where the data in the memory cell is set to “0” (thedata “1” in the first page, and the data “1” in the second page), thePDC is set to the high level, the DDC is set to the low level, and theSDC is set to the high level.

In a case where the data in the memory cell is set to “1” (the data “1”in the first page, and the data “0” in the second page) the PDC is setto the low level, the DDC is set to the high level, and the SDC is setto the low level.

In a case where the data in the memory cell is set to “2” (the data “0”in the first page, and the data “0” in the second page), the PDC is setto the low level, the DDC is set to the high level, and the SDC is setto the low level.

In a case where the data in the memory cell is set to “3” (the data “0”in the first page, and the data “1” in the second page), the PDC is setto the low level, the DDC is set to the low level, and the SDC is set tothe low level.

Each data in the PDC, the DDC and the SDC is set by supplying thesignals BLC1, BLC2, DTG, REG and VREG in a predetermined order andtransferring data of the PDC, the DDC, the SDC and the TDC. It is to benoted that a specific operation will be eliminated.

(Program Operation) (S24)

A program operation is completely the same as the first page programoperation. Writing is not executed when data “1” is stored in the PDC,and writing is carried out when data “0” is stored in the same.

(Verify Operation) (S25, S26 and S27)

Program verify reading is the same as the read operation. However, averify level “b′”, “c′” or “d′” corresponds to a level obtained byadding a margin to a read level, and it is set to a level slightlyhigher than the read level. Verify reading is executed by using thisverify level “b′”, “c′” or “d′”. For example, the verify level “b′” is anegative voltage, and the verify level “c′” or “d′” is a positivevoltage.

The verify operation is executed in the order of, e.g., the verifylevels “b′”, “c′” and “d′”.

That is, the verify level “b′” is first set to the word line, andwhether a threshold voltage of the memory cell has reached the verifylevel “b′” is verified (S25). As a result, when the threshold voltage ofthe memory cell has reached the verify level, the PDC changes to thehigh level, and writing is not executed. On the other hand, when thethreshold voltage has not reached the verify level, the PDC changes tothe low level, and writing is executed in the next program.

Thereafter, the verify level “c′” is set to the word line, and whetherthe threshold voltage of the memory cell has reached the verify level“c′” is verified (26). As a result, when the threshold voltage of thememory cell has reached the verify level, the PDC is set to the highlevel, and writing is not executed. On the other hand, when thethreshold voltage has not reached the verify level, the PDC is set tothe low level, and writing is executed in the next program.

Then, the verify level “d′” is set to the word line, and whether thethreshold voltage of the memory cell has reached the verify level “d′”is verified (S27). As a result, when the threshold voltage of the memorycell has reached the verify level, the PDC is set to the high level, andwriting is not executed. On the other hand, when the threshold voltagehas not reached the verify level, the PDC is set to the low level, andwriting is executed in the next program.

The program operation and the verify operation are repeated in thismanner until the PDCs in all the data storage circuits 10 are set to thehigh level.

A specific verify operation will now be described hereinafter.

(Verify (b′)) (S25)

In this program verify operation, a verify voltage “b′” is given to aselected word line.

First, a read potential Vread is supplied to a non-selected word lineand a select line SG1 in a selected block. The signal BLCLAMP of thedata storage circuit 10 is set to 1V+Vth, and the signal BLC2 of thesame is set to Vdd+Vth, thereby pre-charging a bit line. At the time ofwriting data “2” or “3” in a memory cell, data stored in the SDC is “0”.Therefore, the bit line is not pre-charged, but the bit line ispre-charged only in writing data “0” or “1” in the memory cell.

Then, a select line SG2 of the cell on the source side is set to thehigh level. Since the cell is turned off when a threshold voltagethereof is higher than the potential “b′”, the bit line remains in thehigh level. Furthermore, since the cell is turned on when the thresholdvoltage is lower than the potential “b′”, the bit line is set to Vss.During discharge of this bit line, the node N3 of the TDC is temporarilyset to Vss, the signal REG is set to the high level to turn on thetransistor 61 q, and data in the DDC is transferred to the TDC.

Then, the signal DTG is set to the high level to temporarily turn on thetransistor 61 s, and data in the PDC is transferred to the DDC.Thereafter, data in the TDC is transferred to the PDC. Subsequently, thesignal BLPRE of the data storage circuit is set to a voltage Vdd+Vth toturn on the transistor 61 u, and the node N3 of the TDC is pre-chargedto Vdd. Then, the signal BLCLAMP is set to 0.9 V+Vth to turn on thetransistor 61 t. Then, the node N3 of the TDC changes to the low levelwhen the bit line is on the low level, and it changes to the high levelwhen the bit line is on the high level.

Here, the low level is stored in the DDC when writing is executed, andthe high level is stored in the DDC when writing is not executed.Therefore, when the signal VREG is set to Vdd and the signal REG is setto the high level, the node N3 of the TDC is forcibly set to the highlevel only in a case where writing is not performed. After thisoperation, data in the PDC is transferred to the DDC, and a potential ofthe TDC is read to the PDC. The high level is latched in the PDC whenwriting is not executed and when data “1” has been written in the memorycell and a threshold voltage of the cell has reached the verify voltage“b′”. The low level is latched in the PDC when the threshold voltage ofthe cell does not reach the potential “b′” and when data “2” or “3” hasbeen written in the memory cell.

(Verify (c′)) (S26)

In a cell in which data “2” is written, writing is executed by using averify voltage “a′” which is lower than the original verify voltage “c′”in the first page. Then, a threshold voltage is increased by writingdata in an adjacent cell in some cases, and some cells has reached theoriginal verify voltage “c′” in other cases. Therefore, data “2” isfirst verified. In this program verify operation, the verify voltage“c′” is applied to a selected word line.

First, a potential Vread is supplied to a non-selected word line and theselect line SG1 in a selected block, the signal BLCLAMP of the datastorage circuit 10 shown in FIG. 7 is set to 1 V+Vth, and the signal REGis set to Vdd+Vth, thereby pre-charging a bit line. In case of writingdata “0” or “3” in a memory cell, since the DDC is set to the low level,and hence the bit line is not pre-charged. Further, in case of writingdata “1” or “2” in the memory cell, the DDC is set to the high level.Therefore, the bit line is pre-charged.

Then, the select line SG2 of the NAND cell on the source side is set tothe high level. When a threshold voltage of the cell is higher than“c′”, the cell is turned off. Therefore, the bit line remains in thehigh level. Moreover, when the threshold voltage of the cell is lowerthan “c′”, the cell is turned on. Therefore, the bit line is set to Vss.During discharge of the bit line, the node N3 of the TDC is temporarilyset to Vss. Then, the signal REG is set to the high level to turn on thetransistor 61 q, and data in the DDC is transferred to the TDC.

Subsequently, the signal DTG is set to Vdd+Vth to temporarily turn onthe transistor 61 s, and data in the PDC is transferred to the DDC.Then, data in the TDC is transferred to the PDC.

Subsequently, the signal VPRE is set to Vdd and the signal BLPRE is setto Vdd+Vth, whereby the node N3 of the TDC is pre-charged to Vdd.Thereafter, the signal BLCLAMP is set to 0.9 V+Vth to turn on thetransistor 61 t. The node N3 of the TDC changes to the low level whenthe bit line is on the low level, and it changes to the high level whenthe bit line is on the high level.

Here, a low-level signal is stored in the DDC when writing is executed,and a high-level signal is stored in the DDC when writing is notexecuted. Therefore, when the signal VERG is set to Vdd and the signalREG is set to Vdd+Vth, the node N3 of the TDC is forcibly set to thehigh level only when writing is not executed.

Then, data in the PDC is transferred to the DDC, and a potential of theTDC is read to the PDC. The high-level signal is latched in the PDC onlywhen writing is not executed and when data “2” is written in the memorycell and a threshold voltage of the cell has reached “c′” which is theverify voltage. The low level is latched in the PDC when the thresholdvoltage of the cell does not reach “c′” and when data “1” or “3” hasbeen written in the memory cell.

(Verify (d′)) (S27)

In this program verify operation, a verify voltage “d′” is supplied to aselected word line. In this state, Vread is first supplied to anon-selected word line and the select line SG1 in a selected block, thesignal BLCLAMP is set to 1 V+Vth, and the signal BLPRE is set to Vdd+Vthto turn on the transistors 61 t and 61 u, thereby pre-charging a bitline.

Then, the select line SG2 of the cell on the source side is set to thehigh level. Since a cell whose threshold voltage is higher than thepotential “d′” is turned off, the bit line remains in the high level.Additionally, since a cell whose threshold voltage is lower than thepotential “d′” is turned on, the bit line is set to Vss. Duringdischarge of this bit line, the node N3 of the TDC is set to Vss, thesignal REG is set to the high level, the transistor 61 q is turned on,and data in the DDC is transferred to the TDC.

Then, the signal DTG is set to the high level, the transistor 61 s isturned on, and data in the PDC is transferred to the DDC. Thereafter,data in the TDC is transferred to the PDC. Then, the signal BLPRE is setto Vdd+Vth to turn on the transistor 61 u, and the node N3 of the TDC ispre-charged to Vdd. Thereafter, the signal BLCLAMP is set to 0.9 V+Vthto turn on the transistor 61 t. The node N3 of the TDC changes to thelow level when the bit line is on the low level, and it changes to thehigh level when the bit line is on the high level.

Here, the low level is stored in the DDC when writing is executed, andthe high level is stored in the DDC when writing is not executed.Therefore, the signal VREG is set to Vdd, and the signal REG is set tothe high level, thereby turning on the transistor 61 q. Then, the nodeN3 of the TDC is forcibly set to the high level only when writing is notexecuted. After this operation, data in the PDC is transferred to theDDC, and a potential of the TDC is read to the PDC. The high level islatched in the PDC only when writing is not executed and when data “3”has been written in the memory cell and a threshold voltage of the cellhas reached the verify voltage “d′”. The low level is latched in the PDCwhen the threshold voltage of the cell does not reach the potential “d′”and when data “1” or “2” has been written in the memory cell.

When the PDC is on the low level, the write operation is again executed,and this program operation and the verify operation are repeated untildata in the PDCs of all the data storage circuits are set to the highlevel (S28).

In the program verify operation, the three verify operations areexecuted after one program operation. However, in an initial programloop, a threshold voltage is not increased. Therefore, it is possible toeliminate verifying the memory cell data “3”, or verifying the memorycell data “3” and verifying the memory cell data “2”. Further, in aprogram loop close to end, writing the memory cell data “1”, or writingthe memory cell data “2” and the memory cell data “1” has beenterminated. Therefore, these verify operations may be eliminated. Whenverifying the memory cell data “1” is not necessary, data stored in theSDC does not have to be held. Therefore, data required for writing thenext data can be read from the outside.

(Erase Operation)

An erase operation is executed in units of the block indicated by abroken line in FIG. 3. Furthermore, this operation is executed withrespect to two bit lines (BLie and BLio) connected with each datastorage circuit 10 at the same time. After erasing, a threshold value ofa cell becomes memory cell data “0” as shown in FIG. 9C. In case of theRLSB or REASB method, a threshold voltage of an erasing target cell mustbe shallowly set. Therefore, after the erase operation, all word linesin a block are selected to perform the program and program verify readoperations, and the write operation is executed until the verify level“z” is reached as shown in FIG. 9C. At this time, in the program andprogram verify read operations, all word lines are selected, and apotential of a selected word line in verifying is set to z (e.g., −3 V).In other points, these operations are executed like the regular programand program verify read operations. In this manner, the thresholdvoltage after erasing is slightly shallowly set.

According to the embodiment, a plurality of threshold voltages includingdata “0” are set on a negative voltage side lower than 0 V. That is,data “0” and “1” are set on the negative voltage side. Therefore, it isgood enough to set two sets of data, i.e., data “2” and “3” in a rangeof the read voltage Vread. Therefore, since the number of sets of datawhich are set in the range of the read voltage Vread which is the sameas the related art can be reduced, a threshold voltage distribution ofeach data can expanded. Therefore, the number of times of program andverify operations can be decreased, and a writing speed can beincreased.

Further, as described above, the write voltage Vpgm is supplied to aword line of a selected cell in writing, and the write voltage Vpgm isincreased little by little in the program verify operation and writingis repeated until a threshold voltage of the selected cell reaches apredetermined threshold voltage. As shown in FIG. 1B, in case of thisembodiment, the verify levels VC and VD can be set slightly lower thatthose in the related art depicted in FIG. 1A. Therefore, there is anadvantage that the write voltage Vpgm can be reduced, a withstandvoltage of a peripheral circuit can be decreased and the pump circuitwhich generates the write voltage Vpgm can be reduced in size.

It is to be noted that the above has described the two-bit orfour-valued data in the foregoing embodiment. However, the presentinvention is not restricted thereto, and the foregoing embodiment can beapplied to an example of eight-valued data consisting of three bits and16-valued or higher-valued data consisting of four bits. In case ofstoring such multivalued data, it is good enough to set four-valued dataon the negative side in case of eight-valued data and eight-valued dataon the same side in case of 16-valued data, for example.

Moreover, in the foregoing embodiment, a central part of a plurality ofthreshold voltage distributions as multivalued data is set to 0 V.However, the present invention is not restricted thereto, and a centralpart of multivalued data may be set to a neutral threshold voltage (athreshold voltage when an electron does not exist in a floating gate) asshown in FIG. 15A, for example.

Additionally, FIGS. 15B and 15C show a relationship between a differenceB, C or D between each threshold voltage and a neutral threshold voltageand a necessary data retention. As shown in FIGS. 15B and 15C, anecessary data retention margin, i.e., a difference VB-RB, VC-RC orVD-RD between a verify level VB, VC or VD and a read level RB, RC or RDshown in FIGS. 1A and 1B must be largely set as becoming apart from theneutral threshold voltage.

In case of the related art shown in FIG. 15B, VB-RB concerning thedifference B from the neutral threshold voltage is 0.1 V, VC-RCconcerning the difference C from the same is 0.2 V, and VD-RD concerningthe difference D from the same is 0.3 V. A sum total of the differencesis 0.6 V. Therefore, a margin of 0.6 V must be set in the related art.

On the contrary, in case of the present embodiment shown in FIG. 15C,VB-RB concerning the difference B is 0.2 V, VC-RC concerning thedifference C is 0.1 V, and VD-RD concerning the difference D is 0.2 V. Asum total of the differences is 0.5 V. Therefore, setting a margin of0.5 V can suffice.

A total margin can be reduced in this manner, more data can be stored ina range of Vread.

It is to be noted that the row decoder is formed in the P well 58 in theforegoing embodiment. However, the present invention is not restrictedthereto, and it is good enough to form the row decoder in the substrate51 as indicated by a broken line in FIG. 5, supply a negative voltage(−2 V) to the substrate 51 and feed a negative voltage (−3 V) to aselected word line in the erase verify read operation.

Additional advantages and modifications will readily occur to thoseskilled in the art. Therefore, the invention in its broader aspects isnot limited to the specific details and representative embodiments shownand described herein. Accordingly, various modifications may be madewithout departing from the spirit or scope of the general inventionconcept as defined by the appended claims and their equivalents.

1. A semiconductor memory device comprising: a memory cell array having a plurality of memory cells arranged in rows and columns, the memory cells arranged in each of the columns being connected in series to form a NAND unit, the NAND unit having a first select gate connected to a first end of the NAND unit and a second select gate connected to a second end of the NAND unit, the first select gate being connected to one of bit lines, the memory cells arranged in each of the rows being connected to one of word lines, and first and second select lines arranged in a row being connected to respective gates of the first and second select gates; selection transistors which select the word lines, the first select line, and the second select line, gates of the selection transistors being connected in common; and a control circuit which controls potentials of the word lines and the bit lines in accordance with input data, the control circuit controlling write, read, and erase operations of data with respect to the memory cells, wherein the selection transistors are formed on a well, and a first negative voltage is supplied to the well, a first voltage (the first voltage≧the first negative voltage) is supplied to a selected word line and a second voltage is supplied to a non-selected word line in the read operation, wherein the control circuit includes a negative voltage generator circuit which generates the first negative voltage.
 2. The device according to claim 1, wherein the memory cell array has at least one block including at least one of the word lines, the selection transistors are formed on the well arranged in each block, and the first negative voltage is supplied to the well corresponding to a selected block, and one of the first negative voltage and a third voltage (the third voltage≧the first negative voltage) is supplied to the well corresponding to a non-selected block.
 3. The device according to claim 2, wherein, when a potential read from the memory cell is not negative, a fourth voltage (the first voltage≧the fourth voltage) is supplied to the well corresponding to the selected block.
 4. The device according to claim 2, wherein the selection transistors are formed on the well arranged in accordance with at least one of the blocks, and the first negative voltage is supplied to the well.
 5. The device according to claim 1, wherein at least one of a plurality of negative threshold voltages and a plurality of positive threshold voltages is set with respect to the memory cell.
 6. The device according to claim 2, wherein the selection transistors are included in a row decoder selecting the word line.
 7. A semiconductor memory device comprising: a memory cell array having a plurality of memory cells arranged in rows and columns, the memory cells arranged in each of the columns being connected in series to form a NAND unit, the NAND unit having a first select gate connected to a first end of the NAND unit and a second select gate connected to a second end of the NAND unit, the first select gate being connected to one of bit lines, the memory cells arranged in each of the rows being connected to one of word lines, and first and second select lines arranged in a row being connected to respective gates of the first and second select gates; selection transistors which select the word lines and the select lines, gates of the selection transistors being connected in common; and a control circuit which controls potentials of the word lines and the bit lines in accordance with input data, the control circuit controlling write, read, and erase operations of data with respect to the memory cells, wherein the selection transistors are formed on a well, and a first negative voltage is supplied to the well and a first voltage (the first voltage≧the first negative voltage) is supplied to a predetermined non-selected word line in the write operation, wherein the control circuit includes a negative voltage generator circuit which generates the first negative voltage.
 8. The device according to claim 7, wherein the memory cell array has at least one block including at least one of the word lines, the selection transistors are formed on the well arranged in accordance with each block, and the first negative voltage is supplied to the well corresponding to a selected block, and one of the first negative voltage and a second voltage (the second voltage ≧ the first negative voltage) is supplied to the well corresponding to a non-selected block.
 9. The device according to claim 8, wherein the selection transistors are formed on the well arranged in accordance with at least one of the blocks, and the first negative voltage is supplied to the well.
 10. The device according to claim 7, wherein one of a plurality of negative threshold voltages and a plurality of positive threshold voltages is set with respect to the memory cell.
 11. The device according to claim 7, wherein the first negative voltage is supplied to a gate electrode of a memory cell which is positioned on at least a source line side apart from a writing target memory cell.
 12. The device according to claim 9, wherein the selection transistors are included in a row decoder selecting the word line.
 13. A semiconductor memory device comprising: a memory cell array having a plurality of memory cells arranged in rows and columns, the memory cells arranged in each of the columns being connected in series to form a NAND unit, the NAND unit having a first select gate connected to a first end of the NAND unit and a second select gate connected to a second end of the NAND unit, the first select gate being connected to one of bit lines, the memory cells arranged in each of the rows being connected to one of word lines, and first and second select lines arranged in a row being connected to respective gates of the first and second select gates; selection transistors which select the word lines and the select lines, gates of the selection transistors being connected in common; and a control circuit which controls potentials of the word lines and the bit lines in accordance with input data, the control circuit controlling write, read, and erase operations of data with respect to the memory cells, wherein the selection transistors are formed on a well, and a first negative voltage is supplied to the well and a first voltage (the first voltage≧the first negative voltage) is supplied to a selected word line in an erase verify read operation, wherein the control circuit includes a negative voltage generator circuit which generates the first negative voltage.
 14. The device according to claim 13, wherein the memory cell array has at least one block including at least one of the word lines, the selection transistors are formed on a well arranged in accordance with each block, and the first negative voltage is supplied to the well corresponding to a selected block, and one of the first negative voltage and a second voltage (the second voltage≧the first negative voltage) is supplied to the well corresponding to a non-selected block.
 15. The device according to claim 14, wherein the selection transistors are formed on the well arranged in accordance with at least one of the blocks, and the first negative voltage is supplied to the well.
 16. The device according to claim 13, wherein at least one of a plurality of negative threshold voltages and a plurality of positive threshold voltages is set with respect to the memory cell.
 17. The device according to claim 15, wherein the selection transistors are included in a row decoder selecting the word line. 